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Data coding tools for color-coded vector nanolithography

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In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and machining of nanoscale structures with sub-nanometer resolution, while the AFM is a ...

BEILSTEIN-INSTITUT2020

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The rapidly evolving field of 2D materials has developed a plethora of emerging micro/nano devices where atomically-thin materials play a fundamental role. In most cases, this implies the need of nanostructuring them, but due to their delicate nature, conv ...

2020

Fundamental aspects and state-of-the-art results of thermal scanning probe lithography (t-SPL) are reviewed here. t-SPL is an emerging direct-write nanolithography method with many unique properties which enable original or improved nano-patterning in appl ...

2020

Scanning Probe-Directed Assembly and Rapid Chemical Writing Using Nanoscopic Flow of Phospholipids

Vytautas Navikas

Nanofluidic systems offer a huge potential for discovery of new molecular transport and chemical phenomena that can be employed for future technologies. Herein, we report on the transport behavior of surface-reactive compounds in a nanometer-scale flow of ...

AMER CHEMICAL SOC2019

Generalized temporal sampling with active illumination in optical microscopy

Michael Stefan Daniel Liebling, Christian Jaques

Generalized sampling is a flexible framework for signal acquisition, which relaxes the need for ideal pre-filters. Nevertheless, implementation remains challenging for dynamic imaging applications because it requires simultaneously measuring multiple overl ...

SPIE2019

Development of an AFM-based nanomotion detection device for microbiological samples

Wojciech Chomicki

The main goals of this thesis pertain to the development of a device capable of detecting microorganism viability through monitoring the oscillations of a microscopic cantilever transducer, to improve the presently used device and to attempt to explain in ...

EPFL2019

Thermal scanning probe lithography (t-SPL) is an advanced lithography technique in which a heated atomic force microscope tip locally modifies a sample material. Due to the nanometer-sized tip apex diameter, t-SPL enables patterning of sub-10 nm structures ...

EPFL2018

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The geometries of axons, dendrites and their synaptic connections provide important information about their functional properties. These can be collected directly from measurements made on serial electron microscopy images. However, manual and automated se ...

2018

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The fabrication of high-performance solid-state silicon quantum-devices requires high resolution patterning with minimal substrate damage. We have fabricated room temperature (RT) single-electron transistors (SETs) based on point-contact tunnel junctions u ...

2018

Satellites and other complex systems now become more and more software dependent. Even nano satellites have complexity that can be compared to scientific instruments launched to Mars. COTS components and subsystems may now be purchased to support payload d ...

IEEE2017