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Mass-Spectrometric Detection of Low-Ppm Contaminants in Sputter Process Systems at 10-2 Mbar, Using a Directly Exposed Ion-Source

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Mass-Spectrometric Detection of Low-Ppm Contaminants in Sputter Process Systems at 10-2 Mbar, Using a Directly Exposed Ion-Source

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Soft-landing electrospray ion beam deposition of sensitive oligoynes on surfaces in vacuum

A hydrodynamically optimized nano-electrospray ionization source and vacuum interface

High-Resolution Fourier Transform Ion Cyclotron Resonance Mass Spectrometry with Increased Throughput for Biomolecular Analysis

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Electrospray Ion Beam Deposition: Soft-Landing and Fragmentation of Functional Molecules at Solid Surfaces

Electrospray ion beam deposition and mass spectrometry of nonvolatile molecules and nanomaterials

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Focused electron- and ion-beam induced processes