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Far-infrared transmittance and reflectance of PbTiO3, PbZr0.53Ti0.47O3 and PbZr0.75Ti0.25O3 thin films deposited by a sol-gel technique on sapphire substrates were measured between room temperature and 650 degrees C. The spectra were fitted with a classical oscillator model to calculate the dielectric response. Polar-mode parameters are more accurate than data on bulk ceramic materials and are in good agreement with them. An analysis of the soft-made behaviour and comparison with the low-frequency permittivity data clearly indicate the existence of additional relaxation that is always present in the several cm(-1) range, even at room temperature.
Christophe Marcel Georges Galland, Valeria Vento, Sachin Suresh Verlekar, Philippe Andreas Rölli
Andreas Mortensen, David Hernandez Escobar, Léa Deillon, Alejandra Inés Slagter, Eva Luisa Vogt, Jonathan Aristya Setyadji
Katie Sabrina Catherine Rosie Marsden