Direct observation of region by region suppression of the switchable polarization (fatigue) in Pb(Zr,Ti)O-3 thin film capacitors with Pt electrodes
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The domain nucleation and growth during polarization switching in Pb(Zr,Ti)O-3 (PZT) ferroelectric thin film capacitors with Pt top (TE) and bottom electrodes (BE) were studied by means of atomic force microscopy (AFM). The experimental configuration used ...
On many tokamaks the reconstruction of the magnetic field structure in the plasma is supported by polarimetric measurements. Recent proposed and realized methods are based on a far-infrared laser beam with a rotating polarization ellipse. The same instrume ...
A simple and reliable method which allows one to distinguish between the two major microscopic scenarios for the suppression of the switching polarization (P-r(s)), i.e., pinning of ferroelectric domain walls (DWs) through the Pb(Zr,Ti)O-3 film (PZT) (bulk ...
Combined interferometer and polarimeter systems, using a single detecting element per line of sight, are susceptible to perturbation of the interferometric phase when modulation of the polarization vector is applied. This issue has been investigated extens ...
The results of bench tests performed on a new method of combined interferometry/polarimetry for the magnetic-field reconstruction of tokamak plasmas is presented. In particular, the sensitivity obtained in the polarimetric measurement shows the feasibility ...
In order to determine the polarization dependence of multiphoton transitions to excitonic states in solids, we develop a symmetry analysis of the transition-rate formula that includes the study of its transformation properties under permutation of the phot ...
Dielectric properties of perovskites are studied both to gain insight into fundamental aspects of the freezing of polar disorder, and to investigate their technological potential. The dynamics of freezing of polar disorder is investigated in single crystal ...
The domain nucleation and growth during the switching process in ferroelectric PZT thin film capacitors was observed using atomic force microscope (AFM) technique combined with a lock-in amplifier. The measured phase difference between the tip vibration si ...