Texture control of PbTiO3 and Pb(Zr,Ti)O-3 thin films with TiO2 seeding
Graph Chatbot
Chat with Graph Search
Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
A review with 20 ref. Ti oxide films were made by reactive DC magnetron sputtering onto elec. conducting glass substrates. The films were dye sensitized with an Ru complex, thereby yielding nanocryst. solar cells. We investigated the microstructure of the ...
The influence of Ta, Ti and TiO2 adhesion layers with Pt bottom electrodes and the deposition temperature of the metallization on the nucleation and growth of sol-gel derived Pb(Zr0.53Ti0.47)O-3 thin films is reported. Several different PZT annealing profi ...
We have studied deposition by in-situ reactive sputtering of ferroelectric Pb(ZrxTi1-x)O3 (PZT) thin films on Pt and RuO2 electrodes, using temperatures in the 490-620°C range. Nucleation on the electrode was found to be of prime importance for the formati ...
The microstructure and chemical composition of sputtered thin films are strongly correlated with the deposition conditions. In the present work, we report the investigation of the film composition by electron probe microanalysis and photoemission experimen ...
Titanium dioxide is a cheap, chemically stable and non-toxic material. However its electrical properties are unstable and it is a modest semiconductor and a mediocre insulator. For several applications it would be interesting to make it either more insulat ...
Effective transverse piezoelectric coefficient e(31,f) has been measured on (100)/(001) sol-gel Pb(ZrXTi1-X) thin films with compositions between 30% and 45% Zr. A maximum value of 8.07 +/- 0.36 C/m(2) at 40% Zr is found. The influence of the poling field ...