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Décaborane

Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods

Structural and Dynamical Properties of Potassium Dodecahydro-monocarba-closo-dodecaborate: KCB11H12

Towards a frustrated Lewis pair-ionic liquid system

Surface Reactions are Crucial for Energy Storage

Acid-Induced Degradation of Phosphorescent Dopants for OLEDs and Its Application to the Synthesis of Tris-heteroleptic Iridium(III) Bis-cyclometalated Complexes

Optical nanospectroscopy applications in material science

A study of the diffusion brazing process applied to the single crystal superalloy CMSX-4

Graph Chatbot

Chattez avec Graph Search

Surface Reactions are Crucial for Energy Storage

Structural and Dynamical Properties of Potassium Dodecahydro-monocarba-closo-dodecaborate: KCB11H12

Optical nanospectroscopy applications in material science

A study of the diffusion brazing process applied to the single crystal superalloy CMSX-4

Acid-Induced Degradation of Phosphorescent Dopants for OLEDs and Its Application to the Synthesis of Tris-heteroleptic Iridium(III) Bis-cyclometalated Complexes

Evaluation of secondary electron intensities for dopant profiling in ion implanted semiconductors: a correlative study combining SE, SIMS and ECV methods

Towards a frustrated Lewis pair-ionic liquid system