Oil immersion

Science de la nature
Biologie
Anatomie
Histologie

Publications associées (28)

À propos
Confidentialité
Mentions légales

Graph Chatbot

van der Waals Materials for Overcoming Fundamental Limitations in Photonic Integrated Circuitry

Arslan Mazitov

With the advance of on-chip nanophotonics, there is a high demand for high-refractive-index and low-loss materials. Currently, this technology is dominated by silicon, but van der Waals (vdW) materials with a high refractive index can offer a very advanced ...

AMER CHEMICAL SOC2023

Nonlinear Inverse Problems in Quantitative Phase Imaging

Thanh-An Michel Pham

The topic of this thesis is the development of new algorithmic reconstruction methods for quantitative phase imaging (QPI). In the past decade, advanced QPI has emerged as a valuable tool to study label-free biological samples and uncover their 3D structur ...

EPFL2022

Advanced Techniques in Optical Diffraction Tomography

Ahmed Bassam Sayed Ayoub Mohamed Emam

In this thesis, we study the 3 challenges described above. First, we study different reconstruction techniques and assess the fidelity of each reconstruction results by means of structured illumination and phase conjugation. By reconstructing the 3D refrac ...

EPFL2022

Glass-in-glass infiltration for 3D micro-optical composite components

Andreas Mortensen, Yves Bellouard, Jérôme Faist, Gözden Torun, Enrico Casamenti, Luciano Borasi, Mathieu Bertrand

Chalcogenide glass exhibits a wide transmission window in the infrared range, a high refractive index, and nonlinear optical properties; however, due to its poor mechanical properties and low chemical and environmental stability, producing three-dimensiona ...

2022

Correction of spherical surface measurements by confocal microscopy

Toralf Scharf, Wilfried Noell, Jeremy Béguelin

Refractive microlenses are nowadays widely used in optical systems. Characterizing their surface is essential to ensure their quality and to optimize their fabrication process. This is realized by optical surface profilers thanks to their vertical resoluti ...

2020

Optical characterization of high numerical aperture microlenses for quality assessment and fabrication process optimization

Toralf Scharf, Wilfried Noell, Jeremy Béguelin

Accurate characterization of high numerical aperture aspheric microlenses currently is a nonstandard procedure that remains an open challenge. Here, we present and discuss a characterization method based on interferometric and point spread function measure ...

OPTICAL SOC AMER2020

Improving 3D MA-TIRF Reconstruction with Deconvolution and Background Estimation

Emmanuel Emilien Louis Soubies, Sébastien Schaub

Total internal reflection fluorescence microscopy (TIRF) produces 2D images of the fluorescent activity integrated over a very thin layer adjacent to the glass coverslip. By varying the illumination angle (multi-angle TIRF), a stack of 2D images is acquire ...

IEEE2019

Phase resolved characterization of nanoscale features in optical microstructures

Michail Symeonidis

In this study, we apply interferometric microscopy to study the phase, alongside the intensity, of the light field transmitted through a wide variety of samples. Additionally, we conduct those interferometric measurements at different wavelengths within th ...

EPFL2019

Integrated Gallium Phosphide Photonics

Katharina Schmeing

The integration of new materials mediating light-matter interaction in nanoscale devices is a persistent goal in nanophotonics. One of these materials is Gallium phosphide, which offers an attractive combination of a high refractive index (n=3.05 at a wave ...

EPFL2019

Dielectric-sphere-based microsystem for optical super-resolution imaging

Gergely Huszka

Well-established imaging techniques proved that features below the diffraction limit can be observed optically using so-called super-resolution microscopies, which overcome Abbe's resolution limit. In traditional far-field microscopy, the introduction of f ...

EPFL2018

Page 1 sur 3

Optical characterization of high numerical aperture microlenses for quality assessment and fabrication process optimization

Toralf Scharf, Wilfried Noell, Jeremy Béguelin

OPTICAL SOC AMER2020