Publications associées à Boundary scan

A 128-kbit GC-eDRAM With Negative Boosted Bootstrap Driver for 11.3x Lower-Refresh Frequency at a 2.5% Area Overhead in 28-nm FD-SOI

Andreas Peter Burg, Robert Giterman, Halil Andac Yigit, Emmanuel Nieto Casarrubias

Gain-cell embedded DRAM (GC-eDRAM) is a high-density logic-compatible alternative to conventional static random-access memory (SRAM) and embedded DRAM (eDRAM). However, GC-eDRAM suffers from a reduced data retention time (DRT) at deeply-scaled process node ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2023

Current-Based Data-Retention-Time Characterization of Gain-Cell Embedded DRAMs Across the Design and Variations Space

Andreas Peter Burg, Adam Shmuel Teman, Robert Giterman, Andrea Bonetti

The rise of data-intensive applications has resulted in an increasing demand for high-density and low-power on-chip embedded memories. Gain-cell embedded DRAM (GC-eDRAM) is a logic-compatible alternative to conventional static random access memory (SRAM) w ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2020

Neural Dynamics of Grouping and Segmentation Explain Properties of Visual Crowding

Michael Herzog, Gregory Francis, Mauro Manassi

Investigations of visual crowding, where a target is difficult to identify because of flanking elements, has largely used a theoretical perspective based on local interactions where flanking elements pool with or substitute for properties of the target. Th ...

American Psychological Association2017

Monitoring and troubleshooting wireless sensor nodes by measuring the supply current waveform

Pierre-André Farine, Alexis Boegli, Mitko Tanevski

A troubleshooting method for debugging wireless sensor nodes using measurements of the supply current waveform and logic outputs is presented. The troubleshooting and debugging technique uses the supply current waveform in conjunction with the measurement ...

Elsevier Ltd.2010