Concept

Low-voltage electron microscope

Publications associées (307)

Growth of doped silicon nanowires by pulsed laser deposition and their analysis by electron beam induced current imaging

Doped silicon nanowires (NWs) were epitaxially grown on silicon substrates by pulsed laser deposition following a vapour-liquid-solid process, in which dopants together with silicon atoms were introduced into the gas phase by laser ablation of lightly and ...

2011

Conventional and 360 degree electron tomography of a micro-crystalline silicon solar cell

Christophe Ballif, Franz-Josef Haug, Martial Duchamp, Amuthan Ramar

Bright-field (BF) and annular dark-field (ADF) electron tomography in the transmission electron microscope (TEM) are used to characterize elongated porous regions or cracks (simply referred to as cracks thereafter) in micro-crystalline silicon (μc-Si:H) so ...

2011

Influence of Residual Water and Carbon Containing Molecules in Focused Electron Beam Induced Processes

Bamdad Afra

Focused Electron Beam Induced Processing (FEBIP) is a technique used for etching and deposition of micro- and nano-structures using a focused electron beam. FEBIP is commonly carried out in a Scanning Electron Microscope (SEM) with a Gas Injection System ( ...

EPFL2011

Sub-Micron Nano-Composite CoC Hall Sensors by Focused Electron-Beam Induced Deposition for Microbead Detection

Laurent Bernau

In order to track single superparamagnetic microbeads serving as markers in biomolecular assays, high-sensitivity, sub-micron magnetic sensors which can be integrated onto Lab-on-a-chip platforms are needed. This thesis studies the realization and characte ...

EPFL2011

Texture change through film thickness and off-axis accommodation of (002) planes

Alireza Karimi, Akshath Raghu Shetty

We present our recent experimental results on the formation of off-axis texture and crystallographic tilting of crystallites that take place in thin film of transition metal nitrides. For this purpose, the microstructural development of TiAlN film was stud ...

2011

Confirmation of the domino-cascade model by lifepo4/fepo 4 precession electron diffraction

Cyril Cayron

A recent transmission electron microscopy (TEM) method using precession electron diffraction (PED) was used to obtain LiFePO4 and FePO 4 phase mapping at the nanometer-scale level on a large number of particles of sizes between 50 and 300 nm in a partially ...

2011

Standard-free composition measurements of AlxIn1-xN by low-loss electron energy loss spectroscopy

Nicolas Grandjean, Jean-François Carlin

We demonstrate a standard-free method to retrieve compositional information in AlxIn1-xN thin films by measuring the bulk plasmon energy (E-p), employing electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). Two se ...

2011

Ripples and Layers in Ultrathin MoS2 Membranes

Andras Kis, Duncan Thomas Lindsay Alexander, Jacopo Brivio

Single-layer MoS2 is a newly emerging two-dimensional semiconductor with a potentially wide range of applications in the fields of nanoelectronics and energy harvesting. The fact that it can be exfoliated down to single-layer thickness, makes MoS2 interest ...

2011

Indirect identification and compensation of lateral scanner resonances in atomic force microscopes

Georg Fantner

Improving the imaging speed of atomic force microscopy (AFM) requires accurate nanopositioning at high speeds. However, high speed operation excites resonances in the AFM's mechanical scanner that can distort the image, and therefore typical users of comme ...

2011

Quantification of platinum deposition in polymer electrolyte fuel cell membranes

Platinum catalyst dissolution with subsequent reduction and deposition of Pt particles in the membrane can lead to a significant loss of polymer electrolyte fuel cell (PEFC) performance. To quantify the amount of deposited platinum, a novel transmission el ...

2011

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