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An energy filter receiving an electronic beam oriented along an optical axis. The filter includes a deflecting system which deviates in a dispersion plane not including the optical axis the received beam and a dispersing system which guides the beam sent b ...
We explore the defect distribution and the degradation in electron beam pumped Zn1-xCdxSe/ZnSe laser structures by combining cathodoluminescence measurements in a scanning electron microscope with transmission electron microscopy. We found that degradation ...
The reference ferritic-martensitic steel of the European Fusion Technology Program, the 10CrMoNbV MANET cast, has been modified by replacing the elements that result in long term residual radioactivity when irradiated under a fusion neutron spectra by othe ...
We have investigated the optical and structural properties of tensile-strained GaxIn1-xP/InP heterojunctions by cathodoluminescence (CL) in the scanning electron microscope and by transmission electron microscopy (TEM). The lattice mismatch of the samples ...
The characterization of sub-micron gratings is usually performed on scanning electron microscopes, although the dimensions of the features often make the observations difficult. We report here on a new method applicable to III-V and II-VI semiconductors: w ...
Sand erosion tests were performed on WC-Co and WC-CoCr coatings deposited by the high velocity oxy-fuel spraying method. Several analytical techniques, including X-ray diffraction, Auger electron spectroscopy and energy-dispersive spectroscopy in a transmi ...
We use the cathodoluminescence mode of a scanning electron microscope to investigate the depth and lateral dependencies of the electron-hole pairs generation by the electron beam in Al0.4Ga0.6As semiconducting material. A multiquantum well structure acts a ...
The feasibility of using the LEEM technique in neurobiology was tested with experiments on a rat cerebellar granule cell culture. A series of good-quality images, showing fine details such as axons and dendrites of the neuron network, demonstrate that the ...
The cathodoluminescence mode of the scanning electron microscope is used for the first time to investigate the lateral dependence of the electron-hole pair generation by the electron beam of the scanning electron microscope m semiconducting material. A mul ...
The observation of a wedge-shaped semiconductor specimen by transmission electron microscopy (WTEM) is an interesting alternative to conventional TEM. Information on chemical composition, layer thickness down to atomic resolution, spatial extension of the ...
