Publications associées à Sonde ionique focalisée

Controlling crystal cleavage in focused ion beam shaped specimens for surface spectroscopy

Philip Johannes Walter Moll, Matthias Carsten Putzke, Andrew Scott Hunter

Our understanding of quantum materials is commonly based on precise determinations of their electronic spectrum by spectroscopic means, most notably angle-resolved photoemission spectroscopy (ARPES) and scanning tunneling microscopy. Both require atomicall ...

Aip Publishing2024

Identification and thermal healing of focused ion beam-induced defects in GaN using off-axis electron holography

Nicolas Grandjean, Jean-François Carlin, Raphaël Butté, Yi Wang

Thermal healing of focused ion beam-implanted defects in GaN is investigated by off-axis electron holography in TEM. The data reveal that healing starts at temperatures as low as about 250 degrees C. The healing processes result in an irreversible transiti ...

Iop Publishing Ltd2024

Advances in High-Speed, Multiparametric Atomic Force Microscopy

Santiago Harald Andany

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...

EPFL2024

Numerical investigation of two-dimensional Mode-II delamination in composite laminates

Thomas Keller, Anastasios Vassilopoulos, Congzhe Wang

Existing standards for delamination tests on composite materials typically employ one-dimensional (1D) beam specimens. However, such specimens may not represent real delamination scenarios in composite structures, where cracks tend to propagate in two dime ...

Elsevier Sci Ltd2024

Correlating cryo-super resolution radial fluctuations and dual-axis cryo-scanning transmission electron tomography to bridge the light-electron resolution gap

Prabhu Prasad Swain

Visualization of organelles and their interactions with other features in the native cell remains a challenge in modern biology. We have introduced cryo-scanning transmission electron tomography (CSTET), which can ac-cess 3D volumes on the scale of 1 micro ...

Elsevier2023

Room-temperature strength of the interfacial bond between silica inclusions and iron

Andreas Mortensen, Alejandra Inés Slagter, David Hernandez Escobar, Sergio Perosanz Amarillo

The strength of the interface between iron (Fe) and individual spherical silica (SiO2) inclusions of 5 +/- 1 mu m diameter is measured by means of in-situ micro-cantilever bending tests conducted under displacement control within a scanning electron micros ...

Pergamon-Elsevier Science Ltd2023

FIB-Fabrication of Resonating Cantilevers to Explore Symmetry-Breaking in Quantum Materials

Amelia Emily-Kay Estry

Scientific progress and technological advancements on novel materials are often deterred by limitations on size and quality of samples. Materials with electronic phenomena attractive for applications, and presenting many open scientific questions, are ofte ...

EPFL2023

Characterization of transversely confined electron beam-generated plasma using two-dimensional particle-in-cell simulations

Haomin Sun, Guang-Yu Sun

Electron beam-generated plasmas (EBPs) have been used to modify the surface properties. In certain applications, EBPs are transversely confined and their properties are of value to the treatment. In this paper, the characteristics of an electron beam-gener ...

American Institute of Physics (AIP)2023

Toward a brightness upgrade to the SwissFEL: A high gradient traveling-wave rf photogun

Mike Seidel, Sven Reiche, Paolo Craievich, Anastasiya Magazinik

The first generation of S-band injectors for free-electron lasers has illustrated high reliability and performance by driving the latest generation of high brightness machines. However, the ultimate electron beam brightness of these devices is limited by t ...

Amer Physical Soc2023

Ionic Liquid Gating of SrTiO3 Lamellas Fabricated with a Focused Ion Beam

Amelia Emily-Kay Estry, Philip Johannes Walter Moll, Evgeny Mikheev

In this work, we combine two previously incompatible techniques for defining electronic devices: shaping three-dimensional crystals by focused ion beam (FIB), and two-dimensional electrostatic accumulation of charge carriers. The principal challenge for th ...

AMER CHEMICAL SOC2022