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Atomic force microscopy (AFM), a member of the scanning probe microscopy (SPM) family, holds a unique position as a nano-characterization instrument in the fields of physics, chemistry, and biology. Its ability to provide atomic resolution and operate in v ...
This work proposes the first fine-grained configurable cell array specifically tailored for the implementation of cryptographic algorithms that can be configured using widely adopted hardware description languages. Our solution can be added as a small, cry ...
IEEE2018
SystemC is emerging as a de-facto standard for digital system design. Since embedded systems include more and more heterogeneous components (e.g., analog/RF front-ends, processor cores, embedded software, digital hardware, sensors, actuators), the need for ...
The quest for technologies with superior device characteristics has showcased Carbon-Nanotube Field-Effect Transistors (CNFET) into limelight. In this work we present physical design techniques to improve the yield of CNFET circuits in the presence of Carb ...
Because the market has an insatiable appetite for new functionality, performance is becoming an increasingly important factor. The telecommunication and network domains are especially touched by this phenomenon but they are not the only ones. For instance, ...
