Publications associées à Compteur

On-Chip Fully Reconfigurable Artificial Neural Network in 16 nm FinFET for Positron Emission Tomography

Edoardo Charbon, Claudio Bruschini, Emanuele Ripiccini, Andrada Alexandra Muntean

Smarty is a fully-reconfigurable on-chip feed-forward artificial neural network (ANN) with ten integrated time-to-digital converters (TDCs) designed in a 16 nm FinFET CMOS technology node. The integration of TDCs together with an ANN aims to reduce system ...

Piscataway2024

Random flip-flop: adding quantum randomness to digital circuits for improved cyber security, artificial intelligence and more

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic, Mario Stipcevic

Harnessing quantum randomness for the generation of random numbers is an important concept crucial for information security and many other computer-related applications. Quantum random number generators (QRNGs) are evolving from bulky, slow, and expensive ...

SPIE2021

Low-power image sensor system with single-photon avalanche diode photodetectors

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic

The invention relates to an image sensor comprising a photodetector array including neighboring photodetector elements, each photodetector element comprising: - a photodetector cell having a photodiode and a reset unit; - a cell control unit coupled with t ...

2021

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors

David Atienza Alonso, Alexandre Sébastien Julien Levisse, Miguel Peon Quiros, Ruben Braojos Lopez, Loris Gérard Duch

Aging effects in digital circuits change the switching characteristics of their transistors, resulting in timing violations that can lead to functional errors at the system level. In particular, bias temperature instability (BTI) is a degradation effect th ...

2020

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultra-Low Power Processors

David Atienza Alonso, Alexandre Sébastien Julien Levisse, Miguel Peon Quiros, Ruben Braojos Lopez, Loris Gérard Duch

Aging effects in digital circuits change the switching characteristics of their transistors, resulting in timing violations that can lead to functional errors at the system level. In particular, BTI is a degradation effect that changes the threshold voltag ...

2020

Triboelectric‐TFT Flip‐Flop for Bistable Latching of Dielectric Elastomer Actuators

Danick Briand, Herbert Shea, Rubaiyet Iftekharul Haque, Alexis Pierre Henri Marette, Xiaobin Ji, Ronan Julien Hinchet

A high‐voltage flip‐flop combining two self‐powered soft sensors with a flexible high‐voltage thin film transistor (HVTFT) is reported, and is used to electrically latch dielectric elastomer actuators (DEAs) in zero and high‐strain states. Two touch‐actuat ...

2019

System and Method for Optimization of Digital Circuits with Timing and Behavior Co-Designed by Introduction and Exploitation of False Paths

Christian Enz, Vincent Frédéric Camus, Jérémy Lucien Maurice Schlachter

A digital circuit including a signal path with a false path, whereby the signal path includes at least 3 logic instances, the digital circuit further including a logic monitoring element for monitoring a part of the digital circuit, and for outputting a cu ...

2017

Photon-Counting Arrays for Time-Resolved Imaging

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic, Samuel Burri

The paper presents a camera comprising 512 x 128 pixels capable of single-photon detection and gating with a maximum frame rate of 156 kfps. The photon capture is performed through a gated single-photon avalanche diode that generates a digital pulse upon p ...

MDPI2016

Hardware implementation aspects of polar decoders and ultra high-speed LDPC decoders

Alexios Konstantinos Balatsoukas Stimming

The goal of channel coding is to detect and correct errors that appear during the transmission of information. In the past few decades, channel coding has become an integral part of most communications standards as it improves the energy-efficiency of tran ...

EPFL2016

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Compteur

On-Chip Fully Reconfigurable Artificial Neural Network in 16 nm FinFET for Positron Emission Tomography

Random flip-flop: adding quantum randomness to digital circuits for improved cyber security, artificial intelligence and more

Low-power image sensor system with single-photon avalanche diode photodetectors

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultra-Low Power Processors

Triboelectric‐TFT Flip‐Flop for Bistable Latching of Dielectric Elastomer Actuators

Low-Power Design of Digital VLSI Circuits around the Point of First Failure

System and Method for Optimization of Digital Circuits with Timing and Behavior Co-Designed by Introduction and Exploitation of False Paths

Photon-Counting Arrays for Time-Resolved Imaging

Hardware implementation aspects of polar decoders and ultra high-speed LDPC decoders

Graph Chatbot

Chattez avec Graph Search

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultra-Low Power Processors

Low-power image sensor system with single-photon avalanche diode photodetectors

Low-Power Design of Digital VLSI Circuits around the Point of First Failure

On-Chip Fully Reconfigurable Artificial Neural Network in 16 nm FinFET for Positron Emission Tomography

Random flip-flop: adding quantum randomness to digital circuits for improved cyber security, artificial intelligence and more

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors

Triboelectric‐TFT Flip‐Flop for Bistable Latching of Dielectric Elastomer Actuators

System and Method for Optimization of Digital Circuits with Timing and Behavior Co-Designed by Introduction and Exploitation of False Paths

Photon-Counting Arrays for Time-Resolved Imaging

Hardware implementation aspects of polar decoders and ultra high-speed LDPC decoders