Marc Pastre

Cette personne n’est plus à l’EPFL

À propos
Confidentialité
Mentions légales

Graph Chatbot

Publications associées (37)

A 300Hz 19b DR capacitive accelerometer based on a versatile front end in a 5th-order ΔΣ loop

Maher Kayal, Marc Pastre

This paper presents a 5th-order ΔΣ capacitive accelerometer. The ΔΣ loop is implemented in mixed signal, the global 5th-order filter having a 2nd-order analog and a 3rd-order digital part. The system can be used with a wide range of sensors, because the mi ...

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2009

Methodology for the Digital Calibration of Analog Circuits and Systems Using Sub-binary Radix DACs

Maher Kayal, Marc Pastre

This paper presents a methodology for digitally calibrating analog circuits and systems. Based on the detection of an imperfection by a simple comparator, a successive approximations algorithm tunes a compensation current. The latter is generated by a sub- ...

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2009

Global 2D modeling of minority and majority substrate coupled currents

Maher Kayal, Jean-Michel Sallese, François Krummenacher, Marc Pastre, Fabrizio Lo Conte

This paper presents a modeling strategy to simulate 2D propagation of electrical perturbations induced by direct biasing of substrate junctions. Identifying parasitic substrate devices such as bipolar transistors reaches rapidly its limit when multiple cur ...

2009

A fully integrated solar battery charger

Maher Kayal, François Krummenacher, Marc Pastre

This paper presents a solar charger ASIC for Nickelbased (NiCd or NiMH) batteries. The system is fully integrated and no external component is needed. The ASIC includes a voltage reference, a low-impedance switch, an oscillator, a poweron reset, and a digi ...

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2009

Substrate current modeling for high-voltage smart power BCD technology

Maher Kayal, François Krummenacher, Marc Pastre, Fabrizio Lo Conte

This paper presents a compact- and a macro-model for estimating and simulating the perturbations induced in the substrate by high-voltage transistors switching inductive loads. On one hand, it allows the designer to predict the amount of switching noise ge ...

2008

Structured design based on the inversion factor parameter: Case study of ΔΣ modulator system

Maher Kayal, Marc Pastre, Danica Stefanovic

This paper presents the design flow from system-level specifications to transistor-level design for three different fully-differential amplifiers composing the first and the second integrator of a second-order hybrid multi-bit ΔΣ modulator. The circuit-lev ...

2007

A Hall sensor analog front end for current measurement with continuous gain calibration

Maher Kayal, Marc Pastre

This paper presents a new technique for continuously calibrating the sensitivity of a current measurement microsystem based on a Hall magnetic field sensor. An integrated reference coil generates a magnetic field for calibration. Using a variant of the cho ...

2007

Digital calibration methodology applied to a sensor microsystem

Maher Kayal, Marc Pastre

This paper presents the application of a complete digital calibration methodology to the improvement of a Hall sensor-based current measurement microsystem. It is a step-by-step illustration of how generic calibration techniques and circuits can be used on ...

2006

Capacitorless 1T DRAM sensing scheme with automatic reference generation

Maher Kayal, Michel Declercq, Marc Pastre, Serguei Okhonin, Louis Harik

To perform a current sensing in capacitorless 1-transistor (IT) DRAMs on SOI, we have developed a sensing scheme with automatic reference generation. The reference current is generated by an adjustable current source. The electrical calibration of the refe ...

2006

Automatic calibration of Hall sensor microsystems

Maher Kayal, Marc Pastre

In many applications, a Hall element is used for contact-less measurement such as linear and angular positions, electrical current, power and energy, etc. The Hall element fabricated by means of CMOS technology features mediocre characteristics [R.S. Popov ...

2006

Page 3 sur 4