Publications de Maria-Pilar Bernal

Magnetic spin-orbit interaction of light steers Bloch surface waves

Hans Peter Herzig, Myun Sik Kim, Maria-Pilar Bernal, Hongying Zhang, Huihui Lü

We show the directional excitation of Bloch surface waves controlled by the magnetic field of light. The phenomenon in play is the first magnetic spin-orbit interaction of light. It opens new degrees of freedom in the manipulation of light and offers appea ...

IEEE2018

Polarization controlled directional propagation of Bloch Surface Wave

Hans Peter Herzig, Myun Sik Kim, Maria-Pilar Bernal

Bloch surface waves (BSWs) are recently developing alternative to surface plasmon polaritons (SPPs). Due to dramatically enhanced propagation distance and strong field confinement these surface states can be successfully used in on-chip all-optical integra ...

Optical Society of America2017

Experimental evidence of Bloch surface waves on photonic crystals with thin-film LiNbO3 as a top layer

Hans Peter Herzig, Myun Sik Kim, Maria-Pilar Bernal

Strong nonlinear, electro-optical, and thermo-optical properties of lithium niobate (LN) have gained much attention. However, the implementation of LiNbO3 in real devices is not a trivial task due to difficulties in manufacturing and handling thin-film LN. ...

Optical Soc Amer2017

Strong improvement in the photonic stop-band edge sharpness of a lithium niobate photonic crystal slab

Paul Muralt, Scott Harada, Maria-Pilar Bernal

We report on a photonic crystal (PhC) etched into a 380 nm thick lithium niobate (LN) thin film deposited on a MgO substrate by pulsed laser deposition. The transmission properties of this device were assessed by optical near-field measurements and compare ...

AIP American Institute of Physics2009

Determination of local refractive index variations in thin films by heterodyne interferometric scanning near-field optical microscopy

Patrik Willi Hoffmann, Ali Dabirian, Yury Kuzminykh, Giacomo Benvenuti, Maria-Pilar Bernal

We report on a heterodyne interferometric scanning near-field optical microscope developed for characterizing, at the nanometric scale, refractive index variations in thin films. An optical lateral resolution of 80 nm (lambda/19) and a precision smaller th ...

American Institute of Physics2009