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State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics
Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-co
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their
research or who want to understand how to interpret SEM images and analytical re
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their
research or who want to understand how to interpret SEM images and analytical re
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who
This course will present an overview of the different materials characterisation techniques available to materials scientists, engineers in mechanical engineering, chemical engineering, microtechnolog
