Are Foreigners Treated Equally under the Trade-Related Aspects of Intellectual Property Rights Agreement?

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Publications associées (21)

Discrimination against foreigners in the U.S. patent system

Gaétan Jean A de Rassenfosse

Inventions of foreign origin are about ten percentage points less likely to be granted a U.S. patent than domestic inventions. An empirical analysis of 1.5 million U.S. patent applications identifies three systematic differences between foreign and domesti ...

2020

Patent citations reexamined

Kenneth Younge, Jeffrey Kuhn

Many studies rely on patent citations to measure intellectual heritage and impact. In this article, we show that the nature of patent citations has changed dramatically in recent years. Today, a small minority of patent applications are generating a large ...

WILEY2020

The triangular value of patents

Albina Khairullina

This thesis addresses the question of a patent value from three different angles. It comprises three papers on the patent valuation methods. The patent valuation issues are well-known to the world of research and practice. However, the debates over what th ...

EPFL2020

Wanted: A standard for virtual patent marking

Gaétan Jean A de Rassenfosse, Kyle William Higham

Patent marking is used by patentees to provide a form of notice to the public about the existence of a patent and can increase damages awarded in cases of infringement. Historically, marking is done by listing the associated patents on the product they cov ...

OXFORD UNIV PRESS2020

Euclid: The reduced shear approximation and magnification bias for Stage IV cosmic shear experiments

Georges Meylan, Jean-Luc Starck, Yi Wang, Richard Massey

Context. Stage IV weak lensing experiments will offer more than an order of magnitude leap in precision. We must therefore ensure that our analyses remain accurate in this new era. Accordingly, previously ignored systematic effects must be addressed.Aims. ...

EDP SCIENCES S A2020

Impact of negative bias on the piezoelectric properties through the incidence of abnormal oriented grains in Al0.62Sc0.38N thin films

Paul Muralt, Robin Nigon, Thomas La Grange, Silviu Cosmin Sandu, Mohammad Fazel Parsapour Kolour, Lukas Riemer, Xiao Di

Sputter deposited A1ScN films with an Sc content of 38 at % were investigated by X-ray diffraction and electron microscopy to study the influence of the radio frequency (RF) bias on the growth of abnormally oriented grains (AOG). Scanning electron microsco ...

2020

The procurement of innovation by the U.S. government

Gaétan Jean A de Rassenfosse, Emilio Raiteri

The U.S. government invests more than $50 billion per year in R&D procurement but we know little about the outcomes of these investments. We have traced all the patents arising from government funding since the year 2000. About 1.5 percent of all R&D procu ...

2019

Examining inventions, shaping property: The savants and the French patent system

Jérôme Baudry

In 1791, the Loi relative aux découvertes utiles instituted a new patent system in France. Because patents were seen as the expression of the natural right of inventors, prior examination was abolished. However, only a few years after the law was passed, a ...

2019

Geocoding of worldwide patent data

Gaétan Jean A de Rassenfosse

The dataset provides geographic coordinates for inventor and applicant locations in 18.8 million patent documents spanning over more than 30 years. The geocoded data are further allocated to the corresponding countries, regions and cities. When the address ...

2019

Ex-ante measure of patent quality reveals intrinsic fitness for citation-network growth

Kyle William Higham

We have constructed a fitness parameter, characterizing the intrinsic attractiveness for patents to be cited, from attributes of the associated inventions known at the time a patent is granted. This exogenously obtained fitness is shown to determine the te ...

2019

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The triangular value of patents

Albina Khairullina

EPFL2020

Impact of negative bias on the piezoelectric properties through the incidence of abnormal oriented grains in Al0.62Sc0.38N thin films

Paul Muralt, Robin Nigon, Thomas La Grange, Silviu Cosmin Sandu, Mohammad Fazel Parsapour Kolour, Lukas Riemer, Xiao Di

2020