Publications associées à Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory

Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data

Cécile Hébert, Duncan Thomas Lindsay Alexander, James Badro, Farhang Nabiei, Hui Chen

Energy-dispersive X-ray spectroscopy (EDXS) mapping with a scanning transmission electron microscope (STEM) is commonly used for chemical characterization of materials. However, STEM-EDXS quantification becomes challenging when the phases constituting the ...

Elsevier2024

Competition between Carrier Injection and Structural Distortions in Electron-Doped Perovskite Nickelate Thin Films

Duncan Thomas Lindsay Alexander, Bernat Mundet, Jonathan Spring, Jean-Marc Triscone

The discovery of superconductivity in doped infinite-layer nickelate thin films has brought increased attention to the behavior of the doped perovskite phase. Despite this interest, the majority of existing studies pertain to hole-doped perovskite rare-ear ...

WILEY2023

Electron spectrometer calibration method

Tobias Kippenberg, Fabrizio Carbone, Alexey Sapozhnik, Yujia Yang, Thomas La Grange, Arslan Sajid Raja

The present invention concerns an energy dispersion calibration method for calibrating an electron spectrometer of an electron spectrometer system including at least one electron emission source, electron optics and the electron spectrometer. The method co ...

2023

Structure, Oxygen Content and Electric Properties of Titanium Nitride Electrodes in TiNx/La:HfO2/TiNx Stacks Grown by PEALD on SiO2/Si

Philippe Buffat, Elena Suvorova Buffat

This work reports experimental results of the quantitative determination of oxygen and band gap measurement in the TiNx electrodes in planar TiNx top/La:HfO2/TiNx bottom MIM stacks obtained by plasma enhanced atomic layer deposition on SiO2. Methodological ...

2022

Microwave plasma-assisted reactive HiPIMS of InN films: Plasma environment and material characterisation

Aïcha Hessler-Wyser, Johann Michler, Jonathan Emanuel Thomet, Caroline Hain, Thomas Nelis

This work focuses on the low temperature fabrication process of InN thin films via microwave plasma-assisted reactive high power impulse magnetron sputtering (MAR-HiPIMS). The influence of microwave plasma on the HiPIMS discharge process at various nitroge ...

ELSEVIER SCIENCE SA2022

Carbon K-edge x-ray emission spectroscopy of gas phase ethylenic molecules

Majed Chergui, Camila Bacellar Cases Da Silveira, Rebecca Ann Ingle, Luca Longetti, Thomas Roland Barillot

We report on the C K-edge x-ray absorption spectra and the resonant (RXES) and non-resonant (NXES) x-ray emission spectra of ethylene, allene and butadiene in the gas phase. The RXES and NXES show clear differences for the different molecules. Overall both ...

IOP Publishing Ltd2022

Near-Atomic-Scale Mapping of Electronic Phases in Rare Earth Nickelate Superlattices

Duncan Thomas Lindsay Alexander, Bernat Mundet, Jean-Marc Triscone

Nanoscale mapping of the distinct electronic phases characterizing the metal-insulator transition displayed by most of the rare-earth nickelate compounds is fundamental for discovering the true nature of this transition and the possible couplings that are ...

AMER CHEMICAL SOC2021

Substrate-Selective Morphology of Cesium Iodide Clusters on Graphene

Klaus Kern, Yi Wang, Marko Burghard, Stephan Rauschenbach, Sabine Abb, Sven Alexander Szilagyi, Hannah Julia Ochner

Formation and characterization of low-dimensional nanostructures is crucial for controlling the properties of two-dimensional (2D) materials such as graphene. Here, we study the structure of low-dimensional adsorbates of cesium iodide (CsI) on freestanding ...

2020

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Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory

Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data

Competition between Carrier Injection and Structural Distortions in Electron-Doped Perovskite Nickelate Thin Films

Electron spectrometer calibration method

Structure, Oxygen Content and Electric Properties of Titanium Nitride Electrodes in TiNx/La:HfO2/TiNx Stacks Grown by PEALD on SiO2/Si

Microwave plasma-assisted reactive HiPIMS of InN films: Plasma environment and material characterisation

Carbon K-edge x-ray emission spectroscopy of gas phase ethylenic molecules

Waveguide modes spatially resolved by low-loss STEM-EELS

Near-Atomic-Scale Mapping of Electronic Phases in Rare Earth Nickelate Superlattices

Visualizing the importance of oxide-metal phase transitions in the production of synthesis gas over Ni catalysts

Substrate-Selective Morphology of Cesium Iodide Clusters on Graphene

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Chattez avec Graph Search

Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data

Visualizing the importance of oxide-metal phase transitions in the production of synthesis gas over Ni catalysts

Substrate-Selective Morphology of Cesium Iodide Clusters on Graphene

Waveguide modes spatially resolved by low-loss STEM-EELS

Competition between Carrier Injection and Structural Distortions in Electron-Doped Perovskite Nickelate Thin Films

Electron spectrometer calibration method

Microwave plasma-assisted reactive HiPIMS of InN films: Plasma environment and material characterisation

Structure, Oxygen Content and Electric Properties of Titanium Nitride Electrodes in TiNx/La:HfO2/TiNx Stacks Grown by PEALD on SiO2/Si

Carbon K-edge x-ray emission spectroscopy of gas phase ethylenic molecules

Near-Atomic-Scale Mapping of Electronic Phases in Rare Earth Nickelate Superlattices