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Scanning probe microscope for imaging material e.g. metal, has strain gauge coupled to opposed actuators arranged in opposed push or push-pull configuration to measure differential motion of opposed actuators

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Scanning probe microscope for imaging material e.g. metal, has strain gauge coupled to opposed actuators arranged in opposed push or push-pull configuration to measure differential motion of opposed actuators

Graph Chatbot

Chattez avec Graph Search

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SHPM imaging of LiHoF4 at ultra low temperatures

SHPM imaging of LiHoF4 at ultra low temperatures

STED imaging of green fluorescent nanodiamonds containing nitrogen-vacancy-nitrogen centers

SHPM imaging of LiHoF4 at ultra low temperatures

Scanning tunneling microscopy of the charge density wave in 1T-TiSe2 in the presence of single atom defects

Design of a high-bandwidth tripod scanner for high speed atomic force microscopy

High-speed phase-shifting common-path quantitative phase imaging with a piezoelectric actuator

Single molecule fluorescence resonance energy transfer scanning near-field optical microscopy: potentials and challenges

Gentle quantitative measurement of helium density in nanobubbles in silicon by spectrum imaging

Fast detection of single nanoparticles in a microfluidic channel by a microlens array in combination with a conventional optical microscope

A diamond-based scanning probe spin sensor operating at low temperature in ultra-high vacuum