Automated wafer-scale fabrication of electron beam deposited tips for atomic force microscopes using pattern recognition
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We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped a ...
The water meniscus condensed between a nanoscale tip and an atomically flat gold surface was examined under humid conditions using grand canonical Monte Carlo simulations. The molecular structure of the meniscus was investigated with particular focus on it ...
NOVELTY - The scanning method involves generating data signal using a sensor. The first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction su ...
This paper presents a microfluidic push-pull probe for scanning electrochemical microscopy (SECM) consisting of a working microelectrode, an integrated counter/reference electrode and two microchannels for pushing and pulling an electrolyte solution to and ...
Mechanical properties of nanostructures could be remarkably different from their bulk counterparts owing to scale effects, which have attracted considerable research interest in recent years. However, nanomechanics studies are hindered by the difficulties ...
Improving the imaging speed of atomic force microscopy (AFM) requires accurate nanopositioning at high speeds. However, high speed operation excites resonances in the AFM's mechanical scanner that can distort the image, and therefore typical users of comme ...
Scanning electrochem. microscopy (SECM) in the feedback mode was used to study the kinetics of dye regeneration on cis-di(thiocyanato)-bis(2,2'-bipyridyl-4,4''-dicarboxylate) Ru(II)-sensitized TiO2 photoelectrochem. electrodes in contact with room temp. io ...
Two magnetic atoms, one attached to the tip of a scanning tunnelling microscope and one adsorbed on a metal surface, each constituting a Kondo system, have been proposed as one of the simplest conceivable systems potentially exhibiting quantum critical beh ...
High speed atomic force microscopy can provide the possibility of many new scientific observations and applications ranging from nano-manufacturing to the study of biological processes. However, the limited imaging speed has been an imperative drawback of ...
In this paper, we report on the integration technique and fabrication of a scanning probe interrogating the location of charges and their tracks inside quantum devices. Our unique approach is to pattern the charged sensor into a high topography micromechan ...