Optical, structural, and morphological characterisation of epitaxial ZnO films grown by pulsed-laser deposition
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A detailed investigation and characterization of the local properties of individual nanoscopic structures is of great importance for the understanding of novel physical phenomena at the nanoscale as well as for the assessment of their possible use in futur ...
EPFL2011
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We discuss scanning near-field optical microscope based on original double resonant montage of a fibre probe onto the tuning fork and proprietary electronics capable of fast and precise measurements of the resonant frequency and the quality factor of senso ...
2008
The general idea of Nanotechnology is not new – it has been studied since Nobel laureate Richard Feynman outlined the idea in a speech in 1959 – but it's only recently that the progress carried out in the various fields of material, optic, physic and engin ...
EPFL2006
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A new and versatile technique for the wafer scale nanofabrication of silicon nanowire (SiNW) and multiwalled carbon nanotube (MWNT) tips on atomic force microscope (AFM) probes is presented. Catalyst material for the SiNW and MWNT growth was deposited on p ...
The topic of this dissertation is embedded into the new-born field of inorganic nanowires. The research was focused on zinc oxide (ZnO) nanowires, in particular, which besides posing fundamental questions in physics, promise broad range of applications. Zn ...
The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolution images at the nanoscale. When measuring samples with narrow trenches, inclined sidewalls near 90 or nanoscaled structures, standard silicon atomic forc ...
NOVELTY - The microscope has a housing (12), and two actuators (14, 16) are arranged in an opposed push-pull configuration that is coupled to the housing. A support (22) is coupled to the housing and to one of the two actuators at a position that is spaced ...
This thesis looks at surface-bound nanowires and nanoparticles, the mechanical and the metrological properties of which are of practical importance in the realization of nanometer-scale electronics. Atomic force microscope (AFM) was the main instrument of ...
This thesis comes within the scope of tribology studies at the nanometer scale. The experimental techniques used in this work are essentially related to atomic force microscopy, which gives a direct access to the topography and forces of the studied system ...
We have developed hybrid AFM probes with SU-8 polymer body and full platinum and tungsten cantilever and tip. The fabrication process uses surface micromachining of a (100) silicon wafer. The metal (platinum or tungsten) is sputter deposited in oxidation s ...
