Publication

Harnessing the damping properties of materials for high-speed atomic force microscopy

Publications associées (36)

Advances in High-Speed, Multiparametric Atomic Force Microscopy

After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...

EPFL2024

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The Josephson effect in scanning tunneling microscopy (STM) is an excellent tool to probe the properties of a superconductor on a local scale. We use atomic manipulation in a low temperature STM to create mesoscopic single channel contacts and study the Jo ...

NATURE PUBLISHING GROUP2020

Scanning Probe-Directed Assembly and Rapid Chemical Writing Using Nanoscopic Flow of Phospholipids

Vytautas Navikas

Nanofluidic systems offer a huge potential for discovery of new molecular transport and chemical phenomena that can be employed for future technologies. Herein, we report on the transport behavior of surface-reactive compounds in a nanometer-scale flow of ...

AMER CHEMICAL SOC2019

In Atomic force microscopy (AFM), the tip-sample interaction force can be measured through two primary detection techniques: optical beam detection (OBD) and electrical (self-sensing) readout. Compared to the optical method, the convenience of the self-sen ...

EPFL2019

Batch Fabrication of Multilayer Polymer Cantilevers with Integrated Hard Tips for High-Speed Atomic Force Microscopy

Georg Fantner, Nahid Hosseini, Jonathan David Adams, Oliver Peric, Santiago Harald Andany, Matthias Neuenschwander

Increasing the speed of AFM imaging has significant benefits for academic research as well as industrial applications. In many imaging modes, the dynamic response of the cantilever probe dictates the achievable speed. Polymer cantilevers have gained great ...

IEEE2019

Advances in High-Speed Atomic Force Microscopy

Adrian Pascal Nievergelt

High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...

EPFL2018

Vectorial scanning force microscopy using a nanowire sensor

Anna Fontcuberta i Morral, Nicola Rossi

Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant frequency and low dissipation. Furthermore, by virtue of slight asymmetries in ge ...

Nature Publishing Group2017

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Measuring and understanding the complexity that arises when nanostructures interact with their environment are one of the major current challenges of nanoscale science and technology. High-resolution microscopy methods such as scanning probe microscopy hav ...

Annual Reviews2016

We present the design and performance of an ultra-high vacuum (UHV) low temperature scanning probe microscope employing the nitrogen-vacancy color center in diamond as an ultrasensitive magnetic field sensor. Using this center as an atomic-size scanning pr ...

Amer Inst Physics2014

High-frequency multimodal atomic force microscopy

Georg Fantner, Adrian Pascal Nievergelt, Jonathan David Adams, Pascal Damian Odermatt

Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small ...

Beilstein-Institut2014

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