Harnessing the damping properties of materials for high-speed atomic force microscopy
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After decades of technological advancements, high-speed atomic force microscopy (HS-AFM) has emerged as a powerful technique for visualizing dynamic processes. At the nanoscale, the AFM provides valuable insights into the sample by sensing minute interacti ...
EPFL2024
Nanofluidic systems offer a huge potential for discovery of new molecular transport and chemical phenomena that can be employed for future technologies. Herein, we report on the transport behavior of surface-reactive compounds in a nanometer-scale flow of ...
AMER CHEMICAL SOC2019
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Increasing the speed of AFM imaging has significant benefits for academic research as well as industrial applications. In many imaging modes, the dynamic response of the cantilever probe dictates the achievable speed. Polymer cantilevers have gained great ...
IEEE2019
High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...
EPFL2018
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Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant frequency and low dissipation. Furthermore, by virtue of slight asymmetries in ge ...
Nature Publishing Group2017
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Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small ...
We present the design and performance of an ultra-high vacuum (UHV) low temperature scanning probe microscope employing the nitrogen-vacancy color center in diamond as an ultrasensitive magnetic field sensor. Using this center as an atomic-size scanning pr ...
The Josephson effect in scanning tunneling microscopy (STM) is an excellent tool to probe the properties of a superconductor on a local scale. We use atomic manipulation in a low temperature STM to create mesoscopic single channel contacts and study the Jo ...
In Atomic force microscopy (AFM), the tip-sample interaction force can be measured
through two primary detection techniques: optical beam detection (OBD) and electrical (self-sensing)
readout. Compared to the optical method, the convenience of the self-sen ...
Measuring and understanding the complexity that arises when nanostructures interact with their environment are one of the major current challenges of nanoscale science and technology. High-resolution microscopy methods such as scanning probe microscopy hav ...
