InAs1- xPx nanowires grown by catalyst-free molecular-beam epitaxy
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A novel mechanism for ramified island growth in the initial stages of metal heteroepitaxy is reported. Scanning tunneling microscopy measurements reveal that copper islands on Ni(100), as they grow in size, undergo a shape transition. Below a critical size ...
GaN thin layers (200 Angstrom) were grown by gas-source molecular beam epitaxy on c-plane Al2O3 substrates, Transmission electron microscopy reveals that two different epitaxial relationships may occur, The well-known GaN orientation with the c axis perpen ...
The purpose of this work is to compare for thin film analysis, atomic force microscopy, a recently emerging tool, with well-established nuclear analysis techniques. The comparison is conducted using typical samples of InAs/GaAs heterostructures grown by mo ...
Ammonia is used for growing undoped GaN layers by gas source molecular-beam epitaxy on c-plane sapphire substrates. The growth mode is layer by layer as shown by the observation of reflection high-energy electron diffraction intensity oscillations. The str ...
GaAs/AlxGa1-xAs multiple-quantum-well (MQW) structures with identical well thicknesses but with different Al contents x in the barrier (x almost-equal-to 0.1, 0.2, 0.45, and 1) were grown by molecular-beam epitaxy to study the impurity-induced disordering ...
We have evaluated the structure of high-reflectivity InP/InGaAsP distributed Bragg reflectors grown by chemical-beam epitaxy at a growth rate of 3 mu m/h. Transmission electron microscopy combined with electron energy loss spectroscopy indicate lateral flu ...
We have studied the indium and gallium incorporation during growth by chemical beam epitaxy of GaInAs, GaInP and GaInAsP alloys. TMIn, TEGa, cracked AsH3 and PH3 sources were used. The indium incorporation ratio remains nearly constant over the range of pa ...
In vivo calcification of polyethylene and glycol diacrylate (PEG DA) hydrogels of mol. wt. (MW) 400, 1000, 4000, 6000 and 10,000 and polyethylene glycol tetraacrylate (PEG TA) of MW 18,500 was investigated using a rat s.c. model. This study was performed i ...
Large errors may occur in the X-ray diffraction determination of epitaxial layer mismatch, thicknesses or/and periodicity if the substrate miscut angle is not taken into account. Misoriented sample rocking curves are indeed strongly affected when the azimu ...