Semiconductor memorySemiconductor memory is a digital electronic semiconductor device used for digital data storage, such as computer memory. It typically refers to devices in which data is stored within metal–oxide–semiconductor (MOS) memory cells on a silicon integrated circuit memory chip. There are numerous different types using different semiconductor technologies. The two main types of random-access memory (RAM) are static RAM (SRAM), which uses several transistors per memory cell, and dynamic RAM (DRAM), which uses a transistor and a MOS capacitor per cell.
Statistical parameterIn statistics, as opposed to its general use in mathematics, a parameter is any measured quantity of a statistical population that summarises or describes an aspect of the population, such as a mean or a standard deviation. If a population exactly follows a known and defined distribution, for example the normal distribution, then a small set of parameters can be measured which completely describes the population, and can be considered to define a probability distribution for the purposes of extracting samples from this population.
Martèlement de mémoireLe martèlement de mémoire, de l'anglais row hammer ou rowhammer, est un effet secondaire imprévu dans les mémoires dynamiques à accès aléatoire (DRAM) qui provoque une fuite de charge électrique dans des cellules de mémoire, et en conséquence provoque une interaction électrique entre ces cellules et d'autres cellules voisines. Le contenu mémorisé dans ces cellules voisines peut être ainsi modifié. Un programme informatique peut ainsi parvenir à modifier le contenu des cellules voisines sans avoir besoin d'accéder à ces cellules voisines, et donc sans avoir le droit d'y accéder.
Boundary scanBoundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990.
Relevance logicRelevance logic, also called relevant logic, is a kind of non-classical logic requiring the antecedent and consequent of implications to be relevantly related. They may be viewed as a family of substructural or modal logics. It is generally, but not universally, called relevant logic by British and, especially, Australian logicians, and relevance logic by American logicians. Relevance logic aims to capture aspects of implication that are ignored by the "material implication" operator in classical truth-functional logic, namely the notion of relevance between antecedent and conditional of a true implication.
