Efficient scanning for em based target localization
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The operation of the scanning near-field optical microscope based on the double-resonant montage of a fiber probe onto the tuning fork (working frequency of the latter, that is 32 kHz, coincides with the second resonance frequency of the bending oscillatio ...
SPIE-INT SOC OPTICAL ENGINEERING, PO BOX 10, BELLINGHAM, WA 98227-0010 USA2007
During nanoindentation measurements of thin films the formation of cracks within the film as well as of pile-up or sink-in around the indent are known to affect significantly the precision of hardness and Young's modulus values. The crack pattern in brittl ...
The focused electron beam induced deposition process is a promising technique for nano and micro patterning. Electrons can be focused in sub-angström dimensions, which allows atomic-scale resolution imaging, analysis, and processing techniques. Before the ...
A method for preparing and observing clay platelets for size and shape analysis using scanning electron microscopy (SEM) was developed. Samples of the clay platelets were prepared by polyelectrolyte-assisted adsorption onto a pyrolytic graphite surface. Th ...
In-situ materials tests have the advantage to link visual and sensor based information during a dynamic experiment. In this thesis, a compact indenter-scratch test device has been built at EPFL-LSRO and installed inside a Scanning Electron Microscope (SEM) ...
Replica detection is a prerequisite for the discovery of copyright infringement and detection of illicit content. For this purpose, contentbased systems can be an efficient alternative to watermarking. Rather than imperceptibly embedding a signal, content- ...
The aim of this study is to develop coatings on polymer substrates with a combined increase in oxygen barrier performance and toughness, based on SiOx coatings modified with multifunctional organo-silane polymers of controlled polarity and reactivity. As a ...
The electron beam induced current (EBIC) technique was used to characterize a 32 μm thick hydrogenated amorphous silicon n-i-p diode deposited on top of an ASIC, containing several channels of active feedback pre-amplifiers (AFP) with peaking time of 5 ns. ...
This paper seeks to provide an overview of the currently available assessment tools for bidirectional transmission or reflection distribution functions (BTDFs and BRDFs) of complex fenestration systems (CFS). In the first part of the paper, the existing ex ...
In this paper we present our latest developments in high precision positioning and handling systems operating inside an SEM. The Laboratory in Scanning Electron Microscope concept (LAB-in-SEM) is proposed along with a description of our piezodriven manipul ...