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An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

Publications associées (149)

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Tunnelling dynamics between superconducting bound states at the atomic limit

Klaus Kern, Jacob Senkpiel, Haonan Huang

A magnetic impurity is placed on the tip of a scanning tunnelling microscope, allowing direct tunnelling between two Yu-Shiba-Rusinov bound states. This technique can probe and enhance the impurity state lifetime. There is a limit to the miniaturization of ...

2020

Scanning Probe-Directed Assembly and Rapid Chemical Writing Using Nanoscopic Flow of Phospholipids

Vytautas Navikas

Nanofluidic systems offer a huge potential for discovery of new molecular transport and chemical phenomena that can be employed for future technologies. Herein, we report on the transport behavior of surface-reactive compounds in a nanometer-scale flow of ...

AMER CHEMICAL SOC2019

Three-dimensional imaging of integrated circuits with macro- to nanoscale zoom

Gabriel Aeppli, Manuel Guizar Sicairos, Christian David, Michal Odstrcil

The imaging of integrated circuits across different length scales is required for failure analysis, design validation and quality control. At present, such inspection is accomplished using a hierarchy of different probes, from optical microscopy on the mil ...

NATURE PUBLISHING GROUP2019

Nonbenzenoid carbocyclic rings are postulated to serve as important structural elements toward tuning the chemical and electronic properties of extended polycyclic aromatic hydrocarbons (PAHs, or namely nanographenes), necessitating a rational and atomical ...

AMER CHEMICAL SOC2019

Long-life plastic optical fiber probes for scanning near-field optical microscope

Giovanni Dietler, Anton Smirnov, Ekaterina Rostova

Nowadays, sharpened glass fiber - made probes attached to a quartz tuning fork (TF) and exploiting the shear force - based feedback are by far the most popular in the field of SNOM. These probes are expensive, very fragile and their fabrication is difficul ...

SPIE-INT SOC OPTICAL ENGINEERING2018

High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...

EPFL2018

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The unique functionalities of polyelectrolyte brushes depend on several types of specific interactions, including solvent structure effects, hydrophobic forces, electrostatic interactions, and specific ion interactions. Subtle variations in the solution en ...

2018

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The atomic force microscope has become an established research tool for imaging microorganisms with unprecedented resolution. However, its use in microbiology has been limited by the difficulty of proper bacterial immobilization. Here, we have developed a ...

2017

Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy

Georg Fantner, Nahid Hosseini, Adrian Pascal Nievergelt, Maja Dukic Pjanic, Santiago Harald Andany, Chen Yang

Nearly all scanning probe microscopes (SPMs) contain a feedback controller, which is used to move the scanner in the direction of the z-axis in order to maintain a constant setpoint based on the tip-sample interaction. The most frequently used feedback con ...

2017

Scanning Gate Microscope for Cold Atomic Gases

Jean-Philippe Brantut, Samuel Häusler

We present a scanning probe microscopy technique for spatially resolving transport in cold atomic gases, in close analogy with scanning gate microscopy in semiconductor physics. The conductance of a quantum point contact connected to two atomic reservoirs ...

American Physical Society2017