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Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors

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Integrated Electronics for Deep Implants to Remotely Monitor Hemodynamics

Mustafa Besirli

The integration of technology in the medical field has greatly improved accuracy in diagnoses, thus leading to more effective treatments. Wearable and implantable medical devices offer great potential for remote patient monitoring, particularly for heart f ...

EPFL2023

An All-Digital 1 Mbps, 57 pJ/bit Bluetooth Low Energy (BLE) Backscatter ASIC in 65 nm CMOS

James Daniel Rosenthal

We present an all-digital application specific integrated circuit (ASIC) that implements Bluetooth Low Energy (BLE)-compatible backscatter communication. The ASIC was fabricated in a 65 nm CMOS process and occupies an active area of 0.12 mm(2) while consum ...

IEEE2022

SEKV-E: Parameter Extractor of Simplified EKV I-V Model for Low-Power Analog Circuits

Christian Enz, Hung-Chi Han, Antonio D'Amico

This paper presents the open-source Python-based parameter extractor (SEKV-E) for the simplified EKV (sEKV) model, which enables the modern low-power circuit designs with the inversion coefficient design methodology. The tool extracts the essential sEKV pa ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2022

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Harnessing quantum randomness for the generation of random numbers is an important concept crucial for information security and many other computer-related applications. Quantum random number generators (QRNGs) are evolving from bulky, slow, and expensive ...

SPIE2021

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultra-Low Power Processors

David Atienza Alonso, Alexandre Sébastien Julien Levisse, Miguel Peon Quiros, Ruben Braojos Lopez, Loris Gérard Duch

Aging effects in digital circuits change the switching characteristics of their transistors, resulting in timing violations that can lead to functional errors at the system level. In particular, BTI is a degradation effect that changes the threshold voltag ...

2020

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Deeply-scaled three-dimensional (3D) Multi-Processor Systems-on-Chip (MPSoCs) enable high performance and massive communication bandwidth for next-generation computing. However, as process nodes shrink, temperature-dependent leakage dramatically increases, ...

2020

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Claude Shannon, in his famous thesis (1938), revolutionized circuit design by showing that Boolean algebra subsumes all ad-hoc methods that are used in designing switching circuits, or combinational circuits as they are commonly known today. But what is ...

2020

As an increase of intelligent and self-powered devices is forecasted for our future everyday life, the implementation of energy-autonomous devices that can wirelessly communicate data from sensors is crucial. Even though techniques such as voltage scaling ...

EPFL2019

The slowdown of Moore's law, which has been the driving force of the electronics industry over the last 5 decades, is causing serious problem to Integrated Circuits (ICs) improvements. Technology scaling is becoming more and more complex and fabrication co ...

EPFL2018

System and Method for Optimization of Digital Circuits with Timing and Behavior Co-Designed by Introduction and Exploitation of False Paths

Christian Enz, Vincent Frédéric Camus, Jérémy Lucien Maurice Schlachter

A digital circuit including a signal path with a false path, whereby the signal path includes at least 3 logic instances, the digital circuit further including a logic monitoring element for monitoring a part of the digital circuit, and for outputting a cu ...

2017