Design for Test With Unreliable Memories by Restoring the Beauty of Randomness

Andreas Peter Burg, Reza Ghanaatian Jahromi, Marco Widmer
2022
Article

Résumé

This article presents a design-for-test methodology for embedded memories. The methodology relies on a fully random fault model of post-fabrication errors, which results in a low-overhead test strategy. The methodology's effectiveness is demonstrated on an embedded system with faulty memories.

Source officielle

https://infoscience.epfl.ch/record/293309?ln=fr

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Design for Test With Unreliable Memories by Restoring the Beauty of Randomness

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