Load cell with positive, negative and zero stiffness operating modes for milli- to nanonewton contact force monitoring in electrical probing
Publications associées (37)
Graph Chatbot
Chattez avec Graph Search
Posez n’importe quelle question sur les cours, conférences, exercices, recherches, actualités, etc. de l’EPFL ou essayez les exemples de questions ci-dessous.
AVERTISSEMENT : Le chatbot Graph n'est pas programmé pour fournir des réponses explicites ou catégoriques à vos questions. Il transforme plutôt vos questions en demandes API qui sont distribuées aux différents services informatiques officiellement administrés par l'EPFL. Son but est uniquement de collecter et de recommander des références pertinentes à des contenus que vous pouvez explorer pour vous aider à répondre à vos questions.
The unique functionalities of polyelectrolyte brushes depend on several types of specific interactions, including solvent structure effects, hydrophobic forces, electrostatic interactions, and specific ion interactions. Subtle variations in the solution en ...
NOVELTY - The microscope (11) has a set of four actuators (14, 16, 18, 20) i.e. piezoelectric actuators, and a strain gauge coupled to two opposed actuators (14, 18), arranged in opposed push or push-pull configuration to measure the differential motion of ...
The Phoenix microscopy station, designed for the study of Martian dust and soil,consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimet ...
We introduce a method for the acquisition of single molecule force measurements of ligand-receptor interactions using the photonic force microscope (PFM). Biotin-functionalized beads, manipulated with an optical trap, and a streptavidin-functionalized cove ...
Institute of Physics2010
This semester project comes within the scope of studies at the nanometre scale. The experimental techniques used in this work are related to atomic force microscopy, which gives a direct access to the topography and forces of the studied systems. The goal ...
2012
High-speed atomic force microscopy (HS-AFM) is a scanning probe technique capable of recording processes at the nanometre scale in real time. By sequentially increasing the speed of individual microscope components, images of surfaces can be recorded at up ...
a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an inte ...
Self-assembled monolayers of alkylthiolates on gold and alkylsilanes on silicon dioxide have been patterned photocatalytically on sub-100 nm length-scales using both apertured near-field and apertureless methods. Apertured lithography was carried out by me ...
An optical read-out technique is demonstrated that enables mapping the time-dependent electrostatic potential in the tunnel junction of a scanning tunneling microscope with millivolt and nanosecond accuracy. We measure the time-dependent intensity of plasm ...
We report on a set of experimental measurements aimed to fully characterize both the spatial and angular pattern of the optical modes of photonic crystal microcavities. By using a confocal microscope we resolve the spatial distribution of the mode on the s ...