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This lecture introduces 3D techniques in electron microscopy, focusing on FIB Nanotomography compared to other tomographic methods. It covers image processing with ImageJ/Fiji, principles of SEM imaging, tomography, FIB basics, and applications. Practical sessions include image processing, FIB demonstrations, and advanced topics in FIB Nano-Tomography. Students work on Fiji for 3D volume analysis. The lecture explores the challenges and solutions in 3D surface reconstruction, metrology packages like MeX, and shape-from-stereo techniques. It emphasizes the importance of accuracy, resolution, and field of view in 3D microscopy applications.