Lecture

Electron Microscopy: In Situ

In course

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Description

This lecture covers the principles and applications of electron microscopy in situ, focusing on techniques such as time-resolved x-ray tomography, environmental TEM for SOFC, and deformation analysis. Students learn to choose the right method, observe sample evolution, and interpret contrast formation in images.

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Instructors (2)

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Official source

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

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