Electron Microscopy: TEM

This lecture covers the principles of Transmission Electron Microscopy (TEM), focusing on bright field and dark field imaging modes, contrast mechanisms related to crystal structures, diffraction patterns, and the use of objective diaphragms. It also discusses contrasts in terms of thickness, composition, and distortion, as well as the identification of dislocations in crystals. The lecture delves into topics such as Fresnel fringes, astigmatism correction, dislocation burgers vectors, and the effects of dislocations on crystal structures. Additionally, it explores methods for cleaning samples, plasma treatments, and the importance of sample cleanliness for accurate imaging and analysis in TEM.