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This lecture covers the principles and applications of tomography, including 3D microscopy techniques such as atom probe and X-ray tomography. It explores field emission microscopy, ion microscopy, and wide-angle detectors. The instructor discusses the Radon transform, back projection, and tilt-series tomography in TEM. Various imaging methods, including laser-assisted atom probe and wide-angle position-sensitive detectors, are explained. The lecture also delves into the reconstruction of materials at the atomic level using techniques like atom probe tomography. It highlights the importance of tomography in various fields such as medicine, materials science, and nanotechnology.
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