STEM: Scanning Transmission Electron Microscopy

This lecture covers the principles of Scanning Transmission Electron Microscopy (STEM), including diffraction patterns, detectors, and contrast mechanisms. It explains the use of STEM in imaging samples with high resolution and contrast, emphasizing the importance of convergence and collection angles. The lecture also delves into the effects of defocus, camera length, and beam positioning in STEM. Additionally, it explores STEM combined with Energy-Dispersive X-ray Spectroscopy (EDS) for elemental mapping and quantitative analysis. The presentation showcases applications of STEM in various fields, such as material science and nanotechnology, highlighting its advantages and limitations.