Lecture

Intermediate Electron Microscopy Test

In course

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Description

This lecture covers the parameters impacting the size of the probe in electron microscopy, including energy, current, and working distance. It also discusses the different detectors used to obtain good contrast in z, such as the secondary electron detector and the dark field detector. Additionally, it explores how to optimize the spatial resolution of an analysis and prepare samples for transmission electron microscopy, as well as the differences in spectra obtained at various acceleration voltages.

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Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_w020tr7n

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