Metrology Practicals: Introduction

This lecture serves as an experimental addition to MICRO-428 (Metrology), allowing students to practice theoretical concepts and good measurement practices. The course includes 6 experiments focusing on measurement techniques, such as single-photon experiments, AFM, and SEM. Students will work with real instruments, learn about sensitivity in photon-counting devices, timing jitter measurements, and more. The practical sessions will cover topics like dark count rate, afterpulsing statistics, and sensitivity in photon-counting devices. Students will also learn about time-resolved experiments, AFM as a versatile tool for nanoscale measurements, and electron microscopy sample preparation and operation. The course structure involves group study, tasks related to photon-counting devices, and key instrumentation like the SPAD23 single-photon sensor and ps Laser Diode.