Metrology Practicals: Introduction

This lecture serves as an experimental addition to MICRO-428 (Metrology), allowing students to practice theoretical concepts and good measurement practices. The course includes 6 experiments focusing on measurement techniques, such as single-photon experiments, AFM, and SEM. Students will work with real instruments, learn about sensitivity in photon-counting devices, timing jitter measurements, and more. The practical sessions will cover topics like dark count rate, afterpulsing statistics, and sensitivity in photon-counting devices. Students will also learn about time-resolved experiments, AFM as a versatile tool for nanoscale measurements, and electron microscopy sample preparation and operation. The course structure involves group study, tasks related to photon-counting devices, and key instrumentation like the SPAD23 single-photon sensor and ps Laser Diode.

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MICRO-428: Metrology

The course deals with the concept of measuring in different domains, particularly in the electrical, optical, and microscale domains. The course will end with a perspective on quantum measurements, wh

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Cryogenic electron microscopy

Cryogenic electron microscopy (cryo-EM) is a cryomicroscopy technique applied on samples cooled to cryogenic temperatures. For biological specimens, the structure is preserved by embedding in an environment of vitreous ice. An aqueous sample solution is applied to a grid-mesh and plunge-frozen in liquid ethane or a mixture of liquid ethane and propane. While development of the technique began in the 1970s, recent advances in detector technology and software algorithms have allowed for the determination of biomolecular structures at near-atomic resolution.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

International System of Units

The International System of Units, internationally known by the abbreviation SI (for Système International), is the modern form of the metric system and the world's most widely used system of measurement. Established and maintained by the General Conference on Weights and Measures (CGPM), it is the only system of measurement with an official status in nearly every country in the world, employed in science, technology, industry, and everyday commerce.

Metric system

The metric system is a system of measurement that succeeded the decimalised system based on the metre, which had been introduced in France in the 1790s. The historical development of these systems culminated in the definition of the International System of Units (SI) in the mid-20th century, under the oversight of an international standards body. Adopting the metric system is known as metrication. The historical evolution of metric systems has resulted in the recognition of several principles.

Explores the challenges and solutions for managing electron dose in microscopy, emphasizing the importance of accurate dose tracking and analysis.

Delves into the dynamical scattering effect of thickness fringes in TEM images, covering equations, intensity plots, and weak beam imaging.

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Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.