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Gain-cell embedded DRAM (GC-eDRAM) is an interesting alternative to SRAMfor reasons such as high density, low bitcell leakage, logic compatibility, and suitability for 2-port memories. Themajor drawbacks of GC-eDRAMs are their limited data retention times ...
Institute of Electrical and Electronics Engineers2016
With the development of atomic force microscopes that allow higher scan speeds, the need for data acquisition systems (DAQ) that are capable of handling the increased amounts of data in real time arises. We have developed a low cost data acquisition and sc ...
This paper addresses an innovative solution to develop a circuit to perform accelerated stress tests of capacitive microelectromechanical-system (MEMS) switches and shows the use of instruments and equipment to monitor physical aging phenomena. A dedicated ...
Institute of Electrical and Electronics Engineers2012
Integrated circuit (1) comprising: an array of single photon avalanche diodes (SPADs), a plurality of read-out circuits, each SPADs being coupled to one read-out circuit, wherein at least some of the read-out circuits comprise time-to-digital converters (T ...
A troubleshooting method for debugging wireless sensor nodes using measurements of the supply current waveform and logic outputs is presented. The troubleshooting and debugging technique uses the supply current waveform in conjunction with the measurement ...
