Covers the basics of the reciprocal lattice in electron diffraction, including diffraction vector geometry and properties of reciprocal lattice unit cell vectors.
Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.
Covers the historical development and key components of Transmission Electron Microscopy, including electron gun, lenses, apertures, and specimen holders.
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