Transmission Electron Microscopy: basics

This lecture introduces the basics of Transmission Electron Microscopy (TEM), focusing on the principles, applications, and components of TEM instruments. It covers topics such as electron beam energy, sample preparation, imaging modes, and interactions between electrons and samples. The lecture also discusses the importance of lens aberration corrections, resolution, magnification, and depth of field in TEM imaging. Additionally, it explores advanced techniques like High Tension TEM (HT-TEM) and Scanning TEM (STEM) for surface analysis. Overall, the lecture provides a comprehensive overview of TEM, its capabilities, and its significance in various scientific fields.