STEM and EDX

This lecture covers the principles of STEM and EDX, focusing on electron sources, electron beam interactions with specimens, microscope operation in diffraction mode, HAADF detectors, X-ray generation, and EDX microanalysis. It also discusses quantification methods, correction factors, interaction volume simulations, and analytical TEM of multifilament superconducting wires. The instructor presents examples of EDX line-scans, point analysis, element mapping, and grain boundaries analysis using EDX. The lecture emphasizes the importance of SDD technology in EDX analytics and showcases atomic resolution images obtained with the EPFL Titan THEMIS STEM HAADF.