Are you an EPFL student looking for a semester project?
Work with us on data science and visualisation projects, and deploy your project as an app on top of Graph Search.
STEM and EDX
This lecture covers the principles of STEM and EDX, focusing on electron sources, electron beam interactions with specimens, microscope operation in diffraction mode, HAADF detectors, X-ray generation, and EDX microanalysis. It also discusses quantification methods, correction factors, interaction volume simulations, and analytical TEM of multifilament superconducting wires. The instructor presents examples of EDX line-scans, point analysis, element mapping, and grain boundaries analysis using EDX. The lecture emphasizes the importance of SDD technology in EDX analytics and showcases atomic resolution images obtained with the EPFL Titan THEMIS STEM HAADF.
This video is available exclusively on Mediaspace for a restricted audience. Please log in to MediaSpace to access it if you have the necessary permissions.
Watch on Mediaspace