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Introduces Electron Backscatter Diffraction (EBSD) in the SEM for microstructural analysis of various materials, emphasizing sample preparation and pattern indexation.
Introduces basic optical microscopy techniques, including phase contrast and dark-field microscopy, and discusses the challenges of artifact identification.
Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.
Explores various microscopy detectors, their structures, and applications in digital imaging systems, emphasizing low-light imaging and CMOS technology advantages.
