Lectures related to Standard (metrology)

Physics: Motion

Explores the physics of motion, including free fall and trajectory, emphasizing the role of mathematics in predicting and analyzing movement.

Inspection and Metrology: Electron Microscopy

Explores the principles and applications of scanning electron microscopy in micro and nanofabrication, covering electron signals, charging issues, and dimensional measurements.

Scientific Approach and Metrology Introduction

Explores the scientific approach, radioactivity discovery, and metrology fundamentals, emphasizing experimentation, error analysis, and calibration techniques.