Standard (metrology)

Related lectures (23)

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Covers nanoscale metrology, optical microscopy, atomic force microscopy, electron microscopy, and the redefinition of units.

Explores the importance of units, the development of the SI system, and the shift towards defining units based on physical constants.

Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.

Explores MEMS inspection and metrology techniques in cleanroom environments for validating device functionality and meeting design specifications.

Explores the history and principles of radiation detection, as well as its diverse applications.

Introduces quantum sensing and metrology, exploring precision limitations and unified frameworks for analysis with elementary quantum systems.

Explores quantum sensing, rotations, and coherent states in the context of two-level systems, the Bloch Sphere, and Rabi oscillations.

Explores electrical metrology, emphasizing noise and signal analysis, covering topics such as charges, currents, voltages, and various noise sources.

Explores noise reduction techniques in electrical metrology, covering properties of charge, current, voltage, noise sources, and filtering methods.