Zone axis, a term sometimes used to refer to "high-symmetry" orientations in a crystal, most generally refers to any direction referenced to the direct lattice (as distinct from the reciprocal lattice) of a crystal in three dimensions. It is therefore indexed with direct lattice indices, instead of with Miller indices. High-symmetry zone axes through a crystal lattice, in particular, often lie in the direction of tunnels through the crystal between planes of atoms. This is because, as we see below, such zone axis directions generally lie within more than one plane of atoms in the crystal. Miller index The translational invariance of a crystal lattice is described by a set of unit cell, direct lattice basis vectors (contravariant or polar) called a, b, and c, or equivalently by the lattice parameters, i.e. the magnitudes of the vectors, called a, b and c, and the angles between them, called α (between b and c), β (between c and a), and γ (between a and b). Direct lattice vectors have components measured in distance units, like meters (m) or angstroms (Å). A lattice vector is indexed by its coordinates in the direct lattice basis system and is generally placed between square brackets []. Thus a direct lattice vector , or , is defined as . Angle brackets 〈〉 are used to refer to a symmetrically equivalent class of lattice vectors (i.e. the set of vectors generated by an action of the lattice's symmetry group). In the case of a cubic lattice, for instance, 〈100〉 represents [100], [010], [001], [00], [00] and [00] because each of these vectors is symmetrically equivalent under a 90 degree rotation along an axis. A bar over a coordinate is equivalent to a negative sign (e.g., ). The term "zone axis" more specifically refers to the direction of a direct-space lattice vector. For example, since the [120] and [240] lattice vectors are parallel, their orientations both correspond the 〈120〉 zone of the crystal.

About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.
Related courses (2)
MSE-352: Introduction to microscopy + Laboratory work
Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux m
MSE-450: Electron microscopy: advanced methods
With this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data.
Related publications (48)
Related concepts (6)
Precession electron diffraction
Precession electron diffraction (PED) is a specialized method to collect electron diffraction patterns in a transmission electron microscope (TEM). By rotating (precessing) a tilted incident electron beam around the central axis of the microscope, a PED pattern is formed by integration over a collection of diffraction conditions. This produces a quasi-kinematical diffraction pattern that is more suitable as input into direct methods algorithms to determine the crystal structure of the sample.
Reciprocal lattice
In physics, the reciprocal lattice represents the Fourier transform of another lattice. The direct lattice or real lattice is a periodic function in physical space, such as a crystal system (usually a Bravais lattice). The reciprocal lattice exists in the mathematical space of spatial frequencies, known as reciprocal space or k space, where refers to the wavevector. In quantum physics, reciprocal space is closely related to momentum space according to the proportionality , where is the momentum vector and is the reduced Planck constant.
Transmission electron microscopy
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Show more
Related MOOCs (2)
Transmission Electron Microscopy for Materials Sciences
Learn about the fundamentals of transmission electron microscopy in materials sciences: you will be able to understand papers where TEM has been used and have the necessary theoretical basis for takin
Transmission Electron Microscopy for Materials Sciences
Learn about the fundamentals of transmission electron microscopy in materials sciences: you will be able to understand papers where TEM has been used and have the necessary theoretical basis for takin

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.