Related lectures (14)
Chemical Analysis: AES and Data Analysis
Explores Auger Electron Spectroscopy (AES) as a tool for chemical analysis.
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Covers chemical analysis using spectrometry, focusing on X-ray and electron spectrometers, monochromators, and calibration methods.
Surface Analysis: SIMS Examples
Explores surface analysis examples using SIMS, covering segregation, cleaning, and depth profiling of materials.
Auger Spectroscopy & Scanning Probe Microscopy
Covers Auger spectroscopy and Scanning Probe Microscopy techniques for chemical analysis and surface imaging.
Powder Characterisation: Physical, Chemical, Morphology
Explores the physical, chemical, and morphological analysis of powders, emphasizing sampling accuracy and quality control.
SEM Basics: Introduction to Electron Microscopy
Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

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