Course

MSE-735: Scanning and Analytical Transmission Electron Microscopy

Related courses (45)
MSE-352: Introduction to microscopy + Laboratory work
Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux m
MSE-450: Electron microscopy: advanced methods
With this course, the student will learn advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data.
MSE-637(b): Transmission electron microscopy and diffraction (b)
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics
PHYS-405: Experimental methods in physics
The course's objectivs are: Learning several advenced methods in experimental physics, and critical reading of experimental papers.
CH-633: Advanced Solid State and Surface Characterization
State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical
MICRO-561: Biomicroscopy I
Introduction to geometrical and wave optics for understanding the principles of optical microscopes, their advantages and limitations. Describing the basic microscopy components and the commonly used
PHYS-637: Electron Matter Interactions in Transmission Electron Microscopy
This course will present the fundamentals of electron–matter interactions, as occuring in the energy range available in modern transmission electron microscopes, namely 60-300 keV electrons. Diffrac
CH-410: Physical and chemical analyses of materials
The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials.
MSE-637(a): Transmission electron microscopy and diffraction (a)
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics
MSE-704: 3D Electron Microscopy and FIB-Nanotomography
The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.