Discusses X-ray detectors' properties, sensitivity, and signal-to-noise ratio quantification, as well as systematic errors like flat field corrections.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Covers fundamental characterization approaches for solid materials, focusing on elemental analysis, thermal analysis, microscopy, and neutron-based spectroscopies.
