Lecture
This lecture covers the principles of CTEM/SEM, electron sources, electron beams, detectors, and vacuum in electron microscopy. It delves into STEM, HAADF, EDX microanalysis, and the interaction of electrons with samples. The instructor explains the operation of microscopes in diffraction mode, the influence of camera length, and the detection of diffracted electrons. The lecture also discusses high angle incoherent scattering, HAADF imaging, X-ray generation, EDX detectors, and quantification methods. Various examples and applications in materials science, such as superconducting wires and PZT ceramics, are presented. The use of FIB for specimen preparation and the analysis of grain boundaries using EDX are also explored.