Lecture

Scanning Electron Microscopy

In course
DEMO: non nisi excepteur id
Dolore irure sunt amet exercitation commodo nulla consectetur veniam anim proident. Esse proident eu culpa duis nisi fugiat aute dolore. Proident sunt veniam qui exercitation eu sunt. Enim nulla aliqua excepteur ad et ipsum commodo laborum. Occaecat velit nisi nisi tempor.
Login to see this section
Description

This lecture covers the principles and applications of Scanning Electron Microscopy (SEM), including electron beam scanning, signal contrasts, resolution factors, and interaction volumes. It explains the role of secondary electrons, backscattered electrons, and various signals in image formation. The instructor discusses the effects of voltage acceleration, edge effects, and sample charging on SEM imaging. Additionally, it explores techniques to improve resolution, reduce artifacts, and enhance contrast in SEM images. The lecture also delves into the challenges of charge accumulation on insulating samples and the strategies to mitigate these effects.

Instructors (2)
magna incididunt ad ea
Amet deserunt nostrud occaecat ea exercitation commodo tempor enim nostrud commodo consectetur magna. Enim in amet sint non exercitation non aliquip. Irure nisi ad irure consequat enim adipisicing consequat. Amet culpa ullamco eu reprehenderit officia proident voluptate. Amet laborum cillum do mollit. Nulla ea culpa aliquip minim nostrud enim eiusmod non.
aliqua laboris Lorem exercitation
Eiusmod Lorem elit in enim. Do veniam anim sint fugiat mollit exercitation dolor labore aliquip dolore ex. Adipisicing aute nostrud consequat adipisicing fugiat consectetur occaecat voluptate sit quis culpa reprehenderit eu pariatur. Ea minim cillum esse anim laboris tempor amet fugiat. Consequat laboris anim qui do ea anim. Exercitation et nisi voluptate duis irure. Sit in officia consectetur minim magna ullamco pariatur aliqua ut dolore deserunt nisi.
Login to see this section
About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.
Related lectures (101)
Advanced TEM Operation
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
Electron Microscopy Components
Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.
Scanning Electron Microscopy: Fundamentals and Applications
Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.
Dose Management in Electron Microscopy
Explores the challenges and solutions for managing electron dose in microscopy, emphasizing the importance of accurate dose tracking and analysis.
SEM Basics: Introduction to Electron Microscopy
Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.
Show more

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.